Chemistry - ICP-MS analysis (1st element) - Base

Semi-quantitative screening identifies potential problems but regulatory submissions and risk assessment demand definitive quantification - estimating contamination levels proves insufficient when patient safety decisions require precise measurements. Quantitative ICP-MS analysis for specific elements provides definitive measurement of metallic contamination following ISO 10993-12 extraction and EPA 200.8 methodology, delivering regulatory-grade data for elements of toxicological concern. This targeted approach delivers precise quantification supporting risk assessment per ISO 10993-17 that calculates safety margins comparing measured levels against allowable limits derived from toxicological data. The water extraction at physiologically relevant conditions ensures clinical relevance simulating actual patient exposure, while ICP-MS sensitivity enables detection at toxicologically significant levels often below one microgram per device. Critical for validating that implantable devices meet limits for carcinogenic metals like nickel and chromium where chronic exposure poses cancer risks, confirming blood-contacting devices won't release hemolytic elements like copper or zinc at levels causing red blood cell damage, and demonstrating that manufacturing processes adequately remove metallic contamination from machining, welding, or surface treatments. For permanent implants, quantitative elemental analysis supports lifetime exposure calculations required by ISO 10993-17, multiplying daily leaching rates by implant duration to calculate total patient exposure for comparison against toxicological thresholds. Cardiovascular devices require stringent limits because metallic ions directly enter bloodstream, while orthopedic implants need quantification ensuring wear debris and corrosion products don't exceed safe levels. The quantitative data enables statistical process control tracking elemental levels across manufacturing lots, detecting trends suggesting equipment degradation or raw material quality changes before contamination reaches action limits. Regulatory submissions require element-specific quantification with documented detection limits, calibration linearity, and measurement uncertainty supporting safety conclusions.

No.
1006072
Method
Quantitative analysis for single element after extraction
Analyses category
Sample type
Finished device, Bulk material
Sample requirement (type)
Sterile or non sterile
Sample quantities
15 cm2, 0,5 gram
Lead Time Standard (Days)
15
Lead Time Express (Days)
10
Lead Time Super Express (Days)
5
Test facility
Partner Lab
GLP
No
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ISO 10993-12, Ph.Eur. Mono. 0008, Ph.Eur. Mono. 0169
Chemistry - ICP-MS analysis (1 element) - Each additional element

Comprehensive elemental characterization requires measuring multiple elements from precious analytical samples - repeating sample preparation and extraction for each element wastes material and time while introducing variability between measurements. Additional element quantification extends ICP-MS analysis to comprehensively characterize multi-element contamination profiles efficiently by analyzing the same extracted sample. Each additional element uses the same prepared extract and analytical run, maximizing data acquisition while minimizing sample consumption and analytical time through efficient use of instrumental capacity. This modular approach enables customized analysis targeting specific toxicological concerns where certain elements require quantification, regulatory requirements where markets demand specific element data, or manufacturing process validation needs assessing contamination from particular sources. Particularly valuable when initial screening reveals unexpected elements requiring quantification for risk assessment, investigating complex contamination patterns suggesting multiple sources requiring comprehensive profiling, or establishing elemental fingerprints for quality control tracking material consistency. For devices with multiple material components, comprehensive elemental analysis characterizes each material's contribution to total exposure, enabling targeted contamination control addressing specific sources. The approach proves cost-effective compared to individual element analysis because instrument setup, calibration, and quality control apply to all elements measured simultaneously, while sample preparation occurs once regardless of element count. Manufacturing investigations benefit from complete elemental profiles distinguishing between equipment wear introducing chromium and iron, environmental contamination contributing zinc and copper, or raw material impurities containing catalyst residues. The data supports root cause analysis by revealing contamination patterns - correlated elements suggesting common sources versus independent variation indicating multiple contamination routes requiring distinct corrective actions.